1. Applicable wafer: 12’’ wafer & 8’’ wafer
2. Ball size: ф60[um]~ ф760 [um]、ф30 [um] in Lab test level
3. Wafer Bump:
a). Min. Bump pitch: 100 [um]
b). Min. Bump pad size: 85 [um]
c). Max. Bump count: 2.2KK [pins]
*The data is subject to device conditions
4. 12” Wafer case:
a). Min. Thickness: 200[μm]、100[μm] under lab test level
b). Max Warpage Tolerance:6 [mm]/凹case、3 [mm]/凸case
5. Ball mounting Ability
a). Flux Printing Accuracy
Over ф75[um] Ball: +25[um]
Less than ф75[μml Ball: +1/3 of ball diameter
b). Ball mounting Accuracy
Over ф75[um] Ball::±25[um]
Less than ф75[μml Ball: +1/3 of ball diameter
For special case, we can achieve:+13μm
c). Ball Mounting NG Ratio: Less than 30 [ppm]